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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings


Our collaboration with Agilent Technologies resulted in several joint publications:

T. V. Amotchkina, M. K. Trubetskov, A. V. Tikhonravov, S. Schlichting, H. Ehlers, D. Ristau, D. Death, R. J. Francis, V. Pervak, Quality control of oblique incidence optical coatings based on normal incidence measurement data, Optics Express, Vol. 21, Issue 18, pp. 21508-21522 (2013).

T. Amotchkina, M. Trubetskov, A. Tikhonravov, V. Janicki, J. Sancho-Parramon, O. Razskazovskaya, and V. Pervak, "Oscillations in spectral behavior of total losses (1 - R - T) in thin dielectric films," Opt. Express 20, 16129-16144 (2012).

A. Tikhonravov, T. Amotchkina, M. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak. "Optical characterization and reverse engineering based on multiangle spectroscopy." Appl. Opt. 51, 245-254 (2012).

New application notes can be found here: 

Gaining deeper insights into thin film response — overcoming spectral oscillations using the Cary Universal Measurement Accessory

Optical characterization of thin films using a new Universal Measurement Accessory for the Agilent Cary UV-Vis-NIR spectrophotometers

OptiLayer Core Expertise:

OptiLayer allows the designing of all types of multilayers in accordance with desired specifications, among them:

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Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.



Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.


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