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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

Our publications on characterization:

T. V. Amotchkina, M.K. Trubetskov, A.V. Tikhonravov, I.B. Angelov, V. Pervak, Reliable optical characterization of e-beam evaporated TiO2 films deposited at different substrate temperatures, Appl. Opt., Vol. 53, Issue 4, pp. A8-A15 (2014)

T. Amotchkina, M. Trubetskov, A. Tikhonravov, V. Janicki, J. Sancho-Parramon, O. Razskazovskaya, and V. Pervak, "Oscillations in spectral behavior of total losses (1 - R - T) in thin dielectric films," Opt. Express 20, 16129-16144 (2012).

T.V. Amotchkina, M.K. Trubetskov, A.V. Tikhonravov, I.B. Angelov, V. Pervak, "Reliable characterization of e-beam evaporated TiO2 films", in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), paper FA.6.

A. Tikhonravov, T. Amotchkina, M. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak. "Optical characterization and reverse engineering based on multiangle spectroscopy." Appl. Opt. 51, 245-254 (2012).

A. Tikhonravov, M. Trubetskov, T. Amotchkina, G. DeBell, V. Pervak, A. Sytchkova, M. Grilli, and D. Ristau, "Optical parameters of oxide films typically used in optical coating production," Appl. Opt. 50, C75-C85 (2011).

T.V. Amotchkina, V. Janicki, J. Sancho-Parramon, A.V. Tikhonravov, M.K. Trubetskov, and H. Zorc, "General approach to reliable characterization of thin metal films," Appl. Opt. 50, 10, 1453-1464 (2011).

T.V. Amotchkina, M.K. Trubetskov, A. V. Tikhonravov, V. Janicki, J. Sancho-Parramon, and H. Zorc, "Comparison of two techniques for reliable characterization of thin metal-dielectric films," Appl. Opt. 50, 6189-6197 (2011).

A. Tikhonravov, M. Trubetskov, T. Amotchkina, G. DeBell, V. Pervak, and A. Krasilnikova Sytchkova, "Optical Parameters of Oxide Films Typically Used in Optical Coating Production," in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper ThA6.

T. V. Amotchkina, D. Ristau, M. Lappschies, M. Jupe, A. V. Tikhonravov, and M. K. Trubetskov, "Optical Properties of TiO2 -SiO2 Mixture Thin Films Produced by Ion-Beam Sputtering," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper TuA8.

A. V. Tikhonravov, M. K. Trubetskov, O. F. Prosovskiy, and M. A. Kokarev, "Optical Characterization of Thin Metal Films," in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper WDPDP2.

A. A. Tikhonravov, A. V. Tikhonravov, and M. K. Trubetskov, "Accurate formulas for estimating the effect of surface micro-roughness on ellipsometric angles of dielectric thin films," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WE4.

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