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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

 S. Nevas, F. Manoocheri, E. Ikonen, A. V. Tikhonravov, M. A. Kokarev, M. K. Trubetskov, "Optical metrology of thin films using high-accuracy spectrophotometric measurements with oblique angles of incidence", Proc. SPIE. 5250, Advances in Optical Thin Films 234 (2004)

 A. V. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov, and A. Duparre', "Effects of interface roughness on the spectral properties of thin films and multilayers ," Appl. Opt. 42, 5140-5148 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, G. W. DeBell, "On the accuracy of optical thin film parameter determination based on spectrophotometric data", Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 190 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, A. A. Tikhonravov, D. Ristau, S. Günster, Reliable determination of wavelength dependence of thin film refractive index, Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 331 (2003)

 A. V. Tikhonravov, M. K. Trubetskov, M. A. Kokarev, T. V. Amotchkina, A. Duparr, E. Quesnel, D. Ristau, and S. Günster, "Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films ," Appl. Opt. 41, 2555-2560 (2002)

D. Ristau, S. Gunster, S. Bosch, A. Duparre, E. Masetti, J. Ferre-Borrull, G. Kiriakidis, F. Peiro, E. Quesnel, and A. Tikhonravov, "Ultraviolet Optical and Microstructural Properties of MgF 2 and LaF 3 Coatings Deposited by Ion-Beam Sputtering and Boat and Electron-Beam Evaporation ," Appl. Opt. 41, 3196-3204 (2002)

A. Tikhonravov, M. K. Trubetskov, A. V. Krasilnikova, E. Masetti, A. Duparre, E. Quesnel, and D. Ristau, "Invesitigation of the surface micro-roughness of fluoride films by spectrometric ellipsometry," Thin Solid Films 397, 229-237 (2001)

D. Ristau, S. Güunster, S. Bosch, J. Ferrée-Borrull, F. Peiróo, A. Duparrée, E. Masetti, G. Kiriakidis, E. Quesnel, and A. Tikhonravov, "UV-Optical and microstructural properties of MgF2- and LaF3-coatings deposited by IBS and PVD processes," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2001), paper ThA5.

A. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov, and A. Duparre, "Impact of surface roughness on spectral properties of thin films and multilayers," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2001), paper ThB5.

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