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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

A. Tikhonravov, M. K. Trubetskov, M. A. Kokarev, T. V. Amotchkina, and A. Duparre, "Influence of systematic errors in spectral photometric measurements on the determination of optical thin film parameters," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2001), paper TuD2.

A. V. Tikhonravov, M. K. Trubetskov, E. Masetti, A. V. Krasilnikova, I. V. Kochikov, "Sensitivity of the ellipsometric angles psi and delta to the surface inhomogeneity", Proc. SPIE. 3738, Advances in Optical Interference Coatings 173 (1999)

A. V. Tikhonravov, M.K. Trubetskov, G. Clarke, B. T. Sullivan, J. A. Dobrowolski, "Ellipsometric study of optical properties and small inhomogeneities of Nb2O5 films", Proc. SPIE. 3738, Advances in Optical Interference Coatings 183 (1999)

 A. V. Tikhonravov, M. K. Trubetskov, and A. V. Krasilnikova, "Spectroscopic ellipsometry of slightly inhomogeneous nonabsorbing thin films with arbitrary refractive-index profiles: theoretical study," Appl. Opt. 37, 5902-5911 (1998)

 A. V. Tikhonravov, M. K. Trubetskov, "Program package for the ellipsometry of inhomogeneous layers", Proc. SPIE. 2046, Inhomogeneous and Quasi-Inhomogeneous Optical Coatings 167 (1993)

 

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Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

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Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

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