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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings

 

All OptiRE options have been carefully tested on the sets of real measurement data. Results of out studies as well as methodology of the reverse engineering are published in our papers.

 Multi-scan Experimental Data (BBM data)

Measurement data obtained in-situ can be easily imported and loaded to OptiLayer using Multi-Scan Measurements Manager available in OptiRE through Data --> Multi-scan measurements.

In the lower part of the window Measurements database is displayed. The upper part displays layers of the design currently loaded to memory (see below).

Load button loads selected measurement data file to the position selected by an arrow in the design. This position correspond to measurements performed after the deposition of the selected layer. Alternatively you may use Layer column in order to assign a layer to a measurement data file.

Unload button removes measurement data from the selected position in the upper part of the window.

MultiLoad... button invokes a special three-step dialog allowing to perform massive and automated multi-scan measurement assignments. 

Unload button allows you to unload selected measurement file from memory. It is also possible to unload all measurements from memory at once using popup menu invoked after clicking a small arrow at the right part of the button.

Reload button allows you to load measurement file from the database again discarding all possible in-memory modifications, for example, results of measurements preprocessing.

broadband monitoring scans

Example: loading multi-scan data that is already in the OptiLayer database.

Using Scan Discrepancies Option available through

View --> Scan Discrepancies,

you can plot discrepancies between theoretical (or model) spectral characteristic and corresponding measurement scan.

Example: Comparison theoretical and measurement transmittance data related to a 15-layer beamsplitter. The data corresponding to the 3rd, 8th, 12th, and 15th recorded scans are shown below. The scan discrepancies are represented on the right panel.

deviations between experimental and model data

Discrepancies window represent partial discrepancies \(D_j, j=1,...,m\), \(m\) is the number of design layers for the multi-scan measurement mode:

\[ D_j=\frac 1L\sum\limits_{i=1}^L \left(T(d_1,...,d_j;\lambda_i)-\hat{T}(\lambda_i)\right)^2, \]

where \(\lambda_1,...,\lambda_L\) are measurement spectral points, \(\hat{T}(\lambda_i)\) are measurement values.

The scan discrepancies are represented as a diagram (see below) or in a numerical form in Spreadsheet tab.

deviations BBM measurements

Efficient numerical algorithms provided by OptiRE enable performing reliable reverse engineering of multilayer coatings. We demonstrated reliability of the reverse engineering results obtained on the basis of multiscan measurements in our publications.

Recent version of OptiLayer allows you to analyze BBM movies.

Example: a special 15-th layer quarter wave mirrors was produced and two errors (+5% and -7%) in layers 3 and 12, respectively, were imposed. Layer materials - Ta2O5, SiO2; Glass substrate, central wavelength - 600 nm. Deposition technique - magnetron sputtering. Thickness control - well-calibrated time-monitoring. In the course of the deposition process, transmittance data scan were recorded insitu after each layer. The experimental data are compared with the theoretical ones below (left panel). A model with random errors was applied, i.e. the diecrepancy function \(DF\) was minimized with respect to relative errors in layers thicknesses \(\delta_1,...,\delta_{15}\):

\[ DF^2=\frac 1M\frac 1L\sum\limits_{i=1}^M\sum\limits_{j=1}^L\left(T(d_1(1+\delta_1),...,d_m(1+\delta_m))-\hat{T}(\lambda_j)\right)^2 \]

insitu measurement data

Initial fitting of in situ measurements recorded after each layer by theoretical transmittance of 15-layer quarter wave mirror.

on-line transmittance dataAchieved fitting of in situ measurements recorded after each layer by model transmittance of 15-layer quarter wave mirror.

on-line transmittance measurements

Estimated relative errors in layer thicknesses. Two errors in layers number 3 and 12 are reproduced with high accuracy.

 

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.

 

Advanced

Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.

 

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