OptiChar Module of OptiLayer Thin Film Software
|OptiChar enables the optical characterization of single layer films via spectro-photometric and/or ellipsometric data.
It incorporates a variety of thin film models that enable you to determine spectral dependencies of refractive index and extinction coefficient, film thickness, dependence of optical parameters on the thickness of a thin film (bulk inhomogeneity), thickness of surface overlayer.
OptiChar allows you to determine:
A special interface provides an opportunity for a flexible and well-grounded choice of the specific thin film model depending on the available experimental data, its accuracy, and a priori information about the optical properties of the thin film under consideration.
Sophisticated mathematical algorithms enable you to reliably study even the most fine effects in thin films caused by a small absorption, small bulk and surface inhomogeneities.
Using OptiChar you can process:
All our characterization models and methodology have been verified in the frame of collaboration with scientists from world leading research groups.