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OptiLayer:  Your Partner in Design and Post-Production Characterization of Optical Coatings


All OptiRE options have been carefully tested on the sets of real measurement data. Results of out studies as well as methodology of the reverse engineering are published in our papers.

Import of Data

Programs of OptiLayer software family provides various options which enable you to conveniently import of measurement data from various measurement devices. The program also has a software utility that allows the extraction of numerical data from any ASCII file. This utility makes OptiLayer compatible with other commercial thin film packages or with the user's own software. OptiRE is able to import data from almost all well-known spectrophotometers and ellipsometers and widely used data formats:


  • Perkin Elmer spectrophotometers
  • Agilent Cary spectrophotometers
  • Woollam ellipsometers (including depolarization measurements and reflectance/transmittance measurements)
  • JCAMP-DX files
  • Horiba ellipsometers
  • Data from any ASCII files
  • Two-column data files
  • Excel, Origin, etc.
  • Multiscan (BBM) measurement data - only a pair of mouse clicks and large sets of measurement data are loaded into the memory!

optical characterization

Import of multiscan transmittance data provided by broad band optical monitor.

Easy to start

Icons 100x100 1OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings.        Read more...

Docs / Support

Icons 100x100 2Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.



Icons 100x100 3If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page and challenge page.


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