|
OptiChar allows you to characterize substrates on the basis of photometric and ellipsometric data. The set of substrate characterization models is the same as for layer characterization. The only difference is that the thickness of the substrate is not determined in the course of the substrate characterization procedure.You have to specify the thickness of the substrate before starting the characterization procedure. |
 |
 Fitting of measured reflectance data related to CaF2 substrate by model reflectance. |
 Fitting of measured transmittance data related to CaF2 substrate by model transmittance. |
|
A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, A. A. Tikhonravov, D. Ristau, S. Günster, Reliable determination of wavelength dependence of thin film refractive index, Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies 331 (2003) |
|
OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings. Read more…
Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.
If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page.
Look our video examples at YouTube
OptiLayer videos are available here:
Overview of Design/Analysis options of OptiLayer and overview of Characterization/Reverse Engineering options.
The videos were presented at the joint Agilent/OptiLayer webinar.