OptiLayer

  • Import X, Y data: more strict criterion for the selection of the data area introduced: only a sequential set of data is considered. It prevents parsing of accidentally correct strings in a header being a couple of 2 numbers. Such strings can pollute the imported data, causing very undesirable effects.
  • Integrals and Values in Error Analysis in some cases didn’t display correct statistical values. Fixed.
  • Plot options: now Delete allows to remove multiple plots if multiple plots are selected.
  • Improved performance of Trapping option. Now some scenario when trapped layer leaves the constrains in the course of the needle auto procedure are blocked. It allows to obtain designs satisfying trapping criteria easier.
  • New type of monochromatic monitoring strategy for the deposition of IR coatings implemented. In this case it is possible to use turning-point approach due to high thicknesses of layers. It is possible to select which turning point are preferred: any, only minima, or only maxima.
  • Added display of the elapsed time to Random optimization processing.
  • BBM simulator and Monochromatic Simulator extended: now it is possible to exclude some layers from final production analysis, like Yield analysis.
  • Deep Search options now work correctly in Gradual Evolution in Stack and in Multi-Coating (Complementary mirrors) mode. It allows to find complementary pair solution almost without manual refinement configuration and control.
  • Formula Editor (Design Editor). Syntax of formula extended by a construct “@ xxx”, where xxx – the value of the control wavelength, applied to the current group. This construct can appear only after a group of layers surrounded by brackets. If any group of layers is followed by this construct, the indicated control wavelength is applied to this group, substituting the control wavelength of the design. If this construct appears at different level of groups (in subgroups), the resulting coefficient is derived by applying control wavelength shift sequentially. For example, if Control wavelength of the design is 1000 nm, the formula (H L)@500 will generate a design 0.5H 0.5L. The formula ((H L) @500) @3000 will generate a design 1.5H 1.5L
  • Implemented support of inhomogeneous and ThickVar layers in the Stack mode. All targets (Conventional, Color, etc. ) correctly works in this mode. In addition, Cone Angle and Line Width configuration is also supported. Needle optimization and Gradual evolution could be used for configurations of Stacks with ThickVar layers as well.
  • Fixed multiple computational problems for designs with ThickVar layers, including Needle Optimization options.
  • OptiLayer: now it is possible to load a stack instead of Glass object in the U- and g-value window. It allows to study more complicated cases, like composite glasses, consisting of several thick layers.
  • Source can be loaded as a detector. This allows to use single Source database for both types of objects: Sources and Detectors.
  • Inhomogeneities support in Random optimization implemented. Now, if Random optimization is started with Inh/Inter option activated, randomly-generated designs are respecting inhomogeneity settings, in particular, liked inhomogeneous materials. Previous versions simply disabled inhomogeneities.
  • Reload command added to General Information window to all items that are modifiable in memory. This command allows to load the same object from the database in one simple operation without the need to look for this object in the database.
  • Keep only loaded option added to Save As operation (Simple file mode). Several bugs fixed in relation to this operation.
  • Refractiveindex.info database updated to the latest version.

OptiChar

  • Import X, Y data: more strict criterion for the selection of the data area introduced: only a sequential set of data is considered. It prevents parsing of accidentally correct strings in a header being a couple of 2 numbers. Such strings can pollute the imported data, causing very undesirable effects.
  • Source can be loaded as a detector. This allows to use single Source database for both types of objects: Sources and Detectors.
  • Reload command added to General Information window to all items that are modifiable in memory. This command allows to load the same object from the database in one simple operation without the need to look for this object in the database.
  • Keep only loaded option added to Save As operation (Simple file mode). Several bugs fixed in relation to this operation.
  • Refractiveindex.info database updated to the latest version.

OptiRE

  • Import X, Y data: more strict criterion for the selection of the data area introduced: only a sequential set of data is considered. It prevents parsing of accidentally correct strings in a header being a couple of 2 numbers. Such strings can pollute the imported data, causing very undesirable effects.
  • Implemented the first version of Multi-Environment option. It is possible to load different materials and substrates in different environments, and therefore to process the data collected for the samples in different conditions. It is assumed that the model is the same for all environments.
  • Simple point-by-point converter of R/T measurements to substrate data implemented. It can be found in the right-click menu of the Substrate editor.
  • * Current * parameter can be supplied to COM function LoadBackDesign of the DesignDatabase object. It now accepts the parameter [* Current *] (without surrounding [] brackets). In order to remove this model and to return to “normal” configuration you can use RemoveBackSideDesign method of Infor object.
  • Source can be loaded as a detector. This allows to use single Source database for both types of objects: Sources and Detectors.
  • Reload command added to General Information window to all items that are modifiable in memory. This command allows to load the same object from the database in one simple operation without the need to look for this object in the database.
  • Keep only loaded option added to Save As operation (Simple file mode). Several bugs fixed in relation to this operation.
  • Refractiveindex.info database updated to the latest version.