Error analysis: Color characteristics, EFI and Integral values

Corresponding check boxes in Error Analysis Setup window are to be checked. For example, Include Color Error Analysis, optionally with CRI.

Settings of errors in layer thicknesses and offsets in refractive indices/extinction coefficients can be specified exactly in Thickness and Refractive Index tabs exactly in the same way as in conventional statistical error analysis.

Fig. 1. Settings for statistical error analysis of spectral characteristics, color coordinates and CRI.

Fig. 2. Spectral characteristics of the designed coating.

Fig. 3. Refractive index profile of a 5-layer metal-dielectric design.

Fig. 4. Range color target, color coordinates in the Lab system, and color rendering index of the 5-layer design.

Fig. 5. Statistical errors analysis in assumption that errors in thicknesses of TiO₂ and SiO₂ layers are of 1% level and error in the metal layer is of 5% level.

Fig. 6. Color error analysis. Color coordinates of the disturbed designs are shown by black dots. On the right pane, deviations of the luminosity \(L^*\) are presented.

Fig. 7. In Statistics tab of the Error Analysis of Color Coordinates window, expected numerical values of color coordinates (Expect.), Root Mean Square (RMS), and (\(\pm\) Dev) deviations are shown. The deviations are calculated in all available color coordinate systems.

Fig. 8. In Statistics tab of the Error Analysis of Color Coordinates window, expected color rendering index (Expect.) and Root Mean Square (RMS) deviation and deviations (\(\pm\) Dev) of the CRI are shown.

Fig. 9. In Error Analysis of Integrals, Values window, averaged values (Expect.), RMS and deviations (\(\pm\) Dev) of these values.

Important: If the Probability Corridor in Error Analysis Setup window takes its standard value of 68.2689%, then RMS and \(\pm\) Dev values coincide. If the Probability corridor is different (for example, 95% or 99.7%), then  RMS and (\(\pm\) Dev) values differ.

Fig. 10. Yield Analysis Setup of OptiLayer.

Yield Analysis Setup window has three tabs: Yield Options (Fig. 10), Thickness and Refractive index.  Settings of errors in layer thicknesses and offsets in refractive indices/extinction coefficients can be specified exactly in Thickness and Refractive Index tabs exactly in the same way as in conventional statistical error analysis.

In order to perform Yield Analysis, range targets, in particular color range target or integral range target should be specified.

Fig. 11. Error analysis: spectral curves corresponding disturbed designs. Green curves indicate successful test, red curves – unsuccessful tests. The number of good and bad tests as well as yield estimation are shown on the bottom of the window.

Fig. 12. Color Yield Analysis: color points correspond to disturbed designs. Green dots indicate successful test, red dots – unsuccessful tests. Bars on the right panel show luminosity of disturbed designs.