OptiRE module of OptiLayer Thin Film Software

\[ DF^2(X)=\left(\frac 1L\sum\limits_{j=1}^L \frac{S(X;\lambda_j)-\hat{S}(\lambda_j)}{\Delta_j}\right)^2 \rightarrow \min,\]

where \(S\) is the model spectral characteristic of the coating, \(\hat{S}\) is the measurement characteristic, \(X\) is the vector of model parameters, \(\{\lambda_j\}, j=1,…,L\) is the wavelength grid, \(\Delta_j\) are measurement tolerances.

All our reverse engineering models and approaches have been carefully tested and verified in the frame of collaboration with researches from world leading laboratories and institutes. You can find many useful advises in our publications on characterization and on reverse engineering.

References:

1. T. V. Amotchkina, M. K. Trubetskov, A. V. Tikhonravov, S. Schlichting, H. Ehlers, D. Ristau, D. Death, R. J. Francis, V. Pervak, Quality control of oblique incidence optical coatings based on normal incidence measurement data, Optics Express, Vol. 21, Issue 18, pp. 21508-21522 (2013).
2. T.V. Amotchkina, M.K. Trubetskov, A.V. Tikhonravov, V. Pervak,  “Reverse engineering of an output coupler using broadband monitoring data and group delay measurements,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2013), paper WB.2.
3. T. Amotchkina, M. Trubetskov, V. Pervak, B. Romanov, and A. Tikhonravov, “On the reliability of reverse engineering results,” Appl. Opt. 51, 5543-5551 (2012).
4. A. Tikhonravov, T. Amotchkina, M. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak. “Optical characterization and reverse engineering based on multiangle spectroscopy.” Appl. Opt. 51, 245-254 (2012).
5. T.V. Amotchkina, M.K. Trubetskov, V. Pervak, S.Schlichting, H. Ehlers, D. Ristau, and A.V. Tikhonravov. “Comparison of algorithms used for optical characterization of multilayer optical coatings.” Appl. Opt. 50, 3389-3395 (2011).
6. T. Amotchkina, M. Trubetskov, V. Pervak, and A. Tikhonravov. “Design, production and reverse engineering of two-octave antireflection coatings.” Appl. Opt. 50, 6468-6475 (2011).
7. S. Wilbrandt, O. Stenzel, N. Kaiser, M. K. Trubetskov, and A. V. Tikhonravov, “On-line Re-engineering of Interference Coatings,” in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper WC10.
8. A. V. Tikhonravov, M. K. Trubetskov, V. Pervak, F. Krausz, and A. Apolonski, “Design, Fabrication and Reverse Engineering of Broad Band Chirped Mirrors,” in Optical Interference Coatings, OSA Technical Digest (CD) (Optical Society of America, 2007), paper WB4.
9. J. Oliver, A. Tikhonravov, M. Trubetskov, I. Kochikov, and D. Smith, “Real-Time characterization and optimization of e-beam evaporated optical coatings,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2001), paper ME8.