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OptiLayer allows you to take into account Substrate Back Side when experimental reflectance/transmittance are measured with sample back side. In order to see the difference between calculations with and without sample back side put the mouse in and out of the right pane pictures. Recent versions of OptiChar and OptiRE are able to process ellipsometric data having Depolarization caused by back side reflections (see H. Fujuwara, Spectroscopic Ellipsometry Principles and Applications, John Wiley & Sons, 2007, ISBN 978-0-470-01608-4). |
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Depolarization can be included into measurement data set in the course of the characterization process: T.V. Amotchkina, M.K. Trubetskov, A. V. Tikhonravov, V. Janicki, J. Sancho-Parramon, and H. Zorc. “Comparison of two techniques for reliable characterization of thin metal-dielectric films.” Appl. Opt. 50, 6189-6197 (2011). |
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OptiLayer provides user-friendly interface and a variety of examples allowing even a beginner to effectively start to design and characterize optical coatings. Read more…
Comprehensive manual in PDF format and e-mail support help you at each step of your work with OptiLayer.
If you are already an experienced user, OptiLayer gives your almost unlimited opportunities in solving all problems arising in design-production chain. Visit our publications page.
Look our video examples at YouTube
OptiLayer videos are available here:
Overview of Design/Analysis options of OptiLayer and overview of Characterization/Reverse Engineering options.
The videos were presented at the joint Agilent/OptiLayer webinar.
