New Features in OptiLayer 2021 (version 15.12)

OptiLayer

• Added Extended Argument (Operand) option to the UDT. It allows to introduce any spectral characteristic for a different wavelength and angle with respect to the current wavelength and angle of incidence. Arguments of the new spectral characteristic are connected with the current wavelength and angle of incidence with linear relations. Even more, new extended operand (argument) can be defined at a different environment. Therefore many new classes of problems can be formulated and solved by OptiLayer with this new option.
• Integral Specifications database added. Integrals and values window shows how the integral is related to the specified limits. In Yield analysis, Integral Specification is used to estimate the general Yield value, if Integral specification is loaded to memory.
• Model linear inhomogeneities of layer materials can be entered at a separate tab of the Layer Material Editor. When a material with non-zero inhomogeneity is loaded to memory, the inhomogeneity factor is used as default for inhomogeneous evaluation and refinement. Also it is used by OptiChar and OptiRE in all inhomogeneity-related options.
• Improvements and bug fixes of the Inhomogeneities/Interlayer mode. In particular, a preview of inhomogeneous designs added. Inhomogeneity material factors are correctly used for new designs overwriting zero inhomogeneity levels. Now Inhomogeneity/Interlayer settings can be edited in the Design Editor, with optional link to the Inhomogeneity levels of the corresponding Layer Materials.
• Added Randomization option to the Formula Constrained Optimization. When this option is active, for each combination of integer parameters a randomized multi-start optimization is performed. The number of attempts is configurable.
• Symmetric Design mode added, it allows to consider designs symmetrical with respect to its middle point. This option can be useful for immersed coatings in particular, when a resulting coating is composed on two parts connected together with optical glue.
• Export to ODX, Export to LMR, and Export to LZH formats added to COM interfaces.
• UDT Editor has been improved: now it is possible to rename and delete UDT definitions even if they are loaded to the current target specifications.
• GetCharArrLastLayer COM function now works with Back side coating loaded to memory.
• Export to LightTools as a Design file added.
• Integrals and Values Window: now it is possible to move a selected row upwards or downwards using toolbar controls or right-click menu commands “Up” and “Down”.
• UV-Vis formula extended, a constant absorptance term added. This term currently should be used to adjust a small absorptance.
• Extended arguments in UDT – support in digitize, in Error and Yield analysis added.
• During the conversion from Target to Spectral Specifications the setting of Qualifier at the Specification Editor are used as default.
• During conversion from Target to Specifications the settings of the Target Generator are also copied. They are additionally adjusted in order to conform to Specifications Generator format.
• Correction Factors option added to Variator. It allows to estimate the influence of tooling factors on the performance of a coating.
• Export to PCX format now is also supported in 64 bit mode.
• Problems (access violation) during PDF file export (from the Chart Designer and right-click Export menu) fixed.
• Logging of COM operations to a text file implemented. It can significantly simplify the development and management of systems with Automation control of OptiLayer.
• “Continuous Phase” option was applied only globally (Settings -> Axis -> Phase -> Continuous Phase). This problem is fixed, and this option can be applied either globally, to all windows and plots, or locally, only to the currently opened window. Note that globally applied “Continuous Phase” option also affects the synthesis algorithms.
• In some cases Filter Design option generated designs with empty Status in some layers. Fixed.
• Database preview window can be now completely hidden using Data tab of the General Configuration dialog (No Preview check box).
• Colors of characteristics complementary to targets can be evaluated. It is convenient for non-absorbing coatings, since from transmittance one can derive colors on reflection, and vice versa.
• An optional preview of Re(n) and Im(n) added to Substrate and Layer Materials databases. These columns can be activated using Columns… right-click menu of the Database dialog. this feature is especially useful for large databases.
• “Include Header” option added to Copy Special dialog. It provides an additional control on the inclusion of the data header in the data created in Windows Clipboard. In some cases data without the header are more suitable for direct immediate Paste operation into a different spreadsheet.
• Rugate synthesis in the case of composite rugates (combination of rugate layers and ordinary layers) improved. The code in previous version had computational problems for such complicated cases, in the latest release these problems are fixed.
• Added COM interface function to configure Color Range targets represented as polygons.
• Symmetrical mode extended to Constrained optimization, Random optimization, Gradual Evolution
• Filter design: bug and inconsistencies fix in relation to “Use External Target” option. Now it allows wider set of targets to be used.
• LEC21D1 example added. It demonstrates Rugate Synthesis option.

OptiChar

• The first version of COM Automation interfaces added to OptiChar,
• UV-Vis formula extended, a constant absorptance term added. This term currently should be used to adjust a small absorptance manually, this coefficient is not participating in fitting procedure.
• Copy Special command added to Layer Plot and Substrate Plot windows, to Compare Materials window, to Integrated Extinction and to Total Losses Window.
• Plot Ranges command added to right-click menu of the Data Fitting Window.
• Model linear inhomogeneities of layer material model is now saved to the layer material database. This value is displayed at a separate tab of the Layer Material Editor. When a material with non-zero inhomogeneity is loaded to memory, the inhomogeneity factor is used as default for Schröder inhomogeneity model. Also it is used by OptiRE and OptiLayer in all inhomogeneity-related options.
• Export to PCX format now is also supported in 64 bit mode.
• Problems (access violation) during PDF file export (from the Chart Designer and right-click Export menu) fixed.
• Import from ZEISS ThinProcess implemented. It allows to select a plate and a position of interest and to convert it to Measurement file format.
• Logging of COM operations to a text file implemented. It can significantly simplify the development and management of systems with Automation control of OptiChar.
• Database preview window can be now completely hidden using Data tab of the General Configuration dialog (No Preview check box).
• Added Import of ZEISS ThinProcess database (MS SQL Express) measurements.
• Colors of characteristics complementary to measured can be evaluated. It is convenient for non-absorbing coatings, since from transmittance measurements one can derive colors on reflection, and vice versa.
• An optional preview of Re(n) and Im(n) added to Substrate and Layer Materials databases. These columns can be activated using Columns… right-click menu of the Database dialog. this feature is especially useful for large databases.
• “Include Header” option added to Copy Special dialog. It provides an additional control on the inclusion of the data header in the data created in Windows Clipboard. In some cases data without the header are more suitable for direct immediate Paste operation into a different spreadsheet.
• Added COM interface function to configure Color Range targets represented as polygons.
• LEC21C1 Example added. It demonstrates non-parametric characterization of CrOx layer at a Eagle XG glass.

OptiRE

• LabVIEW examples Ex1-Ex3 added to OptiRE.
• Export to ODX and Export to LZH formats added to COM interfaces.
• Integral Specifications DB added. Integrals and values window shows how the integral is related to the specified limits for the current RE model.
• Integrals and Values Window: now it is possible to move a selected row upwards or downwards using toolbar controls or right-click menu commands “Up” and “Down”.
• UV-Vis formula extended, a constant absorptance term added. This term currently should be used to adjust a small absorptance manually, this coefficient is not participating in fitting procedure.
• During the conversion from Target to Spectral Specifications the setting of Qualifier at the Specification Editor are used as default.
• Copy Special command added to Refractive Indices and Extinction Coefficients windows, to Compare Materials window, to Total Losses Window, and to RE Spectra and Specifications & Measurements window.
• Plot Ranges command added to right-click menu of the Data Fitting Window and to RE Spectra window.
• Correction Factors option added to Variator. It allows to estimate the influence of tooling factors on the performance of a coating manually changing correction factor values.
• Model linear inhomogeneities of layer materials is now saved to the layer material database. This value is displayed at a separate tab of the Layer Material Editor. When a material with non-zero inhomogeneity is loaded to memory, the inhomogeneity factor is used as default for all RE models. Also it is used by OptiChar and OptiLayer in all inhomogeneity-related options.
•  Export to PCX format now is also supported in 64 bit mode.
• Problems (access violation) during PDF file export (from the Chart Designer and right-click Export menu) fixed.
• Import from ZEISS ThinProcess implemented. It allows to select a plate and a position of interest nad to convert it to Measurement file format.
• Logging of COM operations to a text file implemented. It can significantly simplify the development and management of systems with Automation control of OptiRE.
• Database preview window can be now completely hidden using Data tab of the General Configuration dialog (No Preview check box).
• Added Import of Zeiss ThinProcess database (MS SQL Express) measurements.
• Colors of characteristics complementary to measured can be evaluated. It is convenient for non-absorbing coatings, since from transmittance measurements one can derive colors on reflection, and vice versa.
• An optional preview of Re(n) and Im(n) added to Substrate and Layer Materials databases. These columns can be activated using Columns… right-click menu of the Database dialog. this feature is especially useful for large databases.
• “Include Header” option added to Copy Special dialog. It provides an additional control on the inclusion of the data header in the data created in Windows Clipboard. In some cases data without the header are more suitable for direct immediate Paste operation into a different spreadsheet.
• Added COM interface function to configure Color Range targets represented as polygons.